RAO ADABALA , Veera Venkata Krishnarjun. AI Algorithms for Early Detection of Defective ECUs in Automotive Production Lines. International Journal of Emerging Research in Engineering and Technology, [S. l.], p. 6–12, 2025. DOI: 10.63282/3050-922X.AECTIC-102. Disponível em: https://ijeret.org/index.php/ijeret/article/view/365. Acesso em: 13 jun. 2026.